AA8000 Multi-Function SEM System

离岸价格

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1 Unit Minimum Order

国:

USA

モデル番号:

AA8000

离岸价格:

（交渉可能） Get Latest Price

ロケーション:

最低注文量の価格:

最低注文量:

1 Unit

パッケージの詳細:

insulated wooden crate

納期:

供給能力:

支払いタイプ:

製品グループ :

Atomic Force Microscope

今すぐお問い合わせください

Angstrom Advanced

USA

無料会員

This product is also available on Amazon for retail.

連絡先担当者 Mr. Angstrom

95 Mill Street, Stoughton, Massachusetts

今すぐお問い合わせください

製品仕様

Brand Name: Angstrom Advanced

タイトルまたは説明

IntroductionsAngstrom AA****-SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstromâ€™s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.Features

High Performance

Field proven image quality
Upgraded scan speed and pixel resolution.
Wide variety of optional instrument
Resolution : 3.0 nm
Magnification : ~1,**0,**0X
Display : Photo ***6X ***6
Search : **0X**0 *0fps
Options : BSE / WDS / EDS / EBSD / Etc.

Gun Coumn

Gun design for stable current supply
Dual field objective lens for spherical
Aberration reduction
Movable aperture for beam centering
Upgraded design of magnetic lens (CL/OL)

Chamber & Stage

5 axis eucentric stage
Option: Stage motorization
EDS,WDS,CCD, Manipulator etc
*0X*0X*7mm

Detector

ET-bar type SE detector
SE & BSE double image mode
Option: BSE detector

GUI

Window based GUI
PC controlled operation
Image thumbnail & storage
Parameter Display

Vacuum System

Automatic & Manual control
Automatic Safety System
R.P+D.P/ R.P+TMP

Image Analyzer

Data transfer to Excel
Particle counter for blob analysis
Multi-focusing & Tiling
3D data view etc

Specifications

Z ELECTRON OPTIC SYSTEM

Resolution

3.0 *@********************

国:	USA
モデル番号:	AA8000
离岸价格:	（交渉可能） Get Latest Price
ロケーション:	-
最低注文量の価格:	-
最低注文量:	1 Unit
パッケージの詳細:	insulated wooden crate
納期:	-
供給能力:	-
支払いタイプ:	-
製品グループ :	Atomic Force Microscope