离岸价格
Get Latest Price( Negotiable )
|1 Unit Minimum Order
国:
China
モデル番号:
-
离岸价格:
( Negotiable ) Get Latest Price
ロケーション:
-
最低注文量の価格:
-
最低注文量:
1 Unit
パッケージの詳細:
WLCSP
納期:
15days
供給能力:
-
支払いタイプ:
T/T
製品グループ :
-
Benefits
• Allows testing of RF devices at the wafer-level
• Adaptable to wafer-level probing and singulated device testing for debug and characterization
• Long life and extended maintenance intervals
• Engineering analysis of WLCSP devices or KGD
• Consistently high test yields
• Maximum mechanical operating window to overcome z-stack non-coplanarity
Key Features
• Low loop inductance and high bandwidth
• Device pitches down to **0 µm
• Variety of contact and body materials to optimize performance
• Manual actuation of singulated devices • Low and stable contact resistance
• Individual probe compliance with large mechanical overdrive
| 国: | China |
| モデル番号: | - |
| 离岸价格: | ( Negotiable ) Get Latest Price |
| ロケーション: | - |
| 最低注文量の価格: | - |
| 最低注文量: | 1 Unit |
| パッケージの詳細: | WLCSP |
| 納期: | 15days |
| 供給能力: | - |
| 支払いタイプ: | T/T |
| 製品グループ : | - |
