タイトルまたは説明

Detailed Product Description ****-based precious metals detector : Unique hardware: . Comply with the most stringent standards for radiation protection at the same time, samples have simple patterns to place and replace supplies. , , *2, , , . Probe target high performance, long life; a new **-bit hardware and software systems, reliability, high efficiency; the camera is equipped with high-resolution positioning systems, measuring more intuitive, convenient, fast. . Fixed configuration with many axial fixture Samples. , , , , . System parameters of liquid crystal display apparatus, the operator may at any time through the screen to observe the internal hardware to the device parameters such as voltage current temperature and so on, can effectively extend equipment life. MoX( Excitation source: Mo target X-ray tube air-cooled (no radiation) *2mm Size measurement points: 1 ~ 2mm :**0 mm×: **0mm×: **0 mm Samples Room: Long **0 mm × width: **0mm × high: 0 ~ *0 mm sample imaging system to enlarge , Software: menu-driven software with the hardware parameters and data to assess and adjust the calculation Computer: select configuration Detector: fixed gas proportional counter closed semiconductor microprocessor-controlled detector and readout circuit Other specifications: :***********0V, *0/*0 Hz Voltage: **0 ~ **7 or **0 ~ **0V, *0/*0 Hz :**8W Maximum Power: **8W :**0mm***0mm***0mm Department biggest size: **0mm * **0mm * **0mm :*0kg Weight: *0kg Specifications 0.3%*9.*9% Analysis range: 0.3% ~ *9.*9% Measurement time: Adaptive ± 0.1% Measurement accuracy: ± 0.1% Test environment: normal ambient temperature Au Ag Pt PbRh Ru CuZn Ni CdW Analysis of elements: Au, Ag, Pt, Pb, Rh, Ru, Cu, Zn, Ni, Cd W XX X-ray sources: X-ray fluorescent tubes **0Kv High-pressure device: 4 ~ *0Kv Analysis: Multi-Channel Analog :Windows***0/Me/XP Operating System: Windows***0/Me/XP Coating measurement: <*0μm Range of coating thickness <*0μm Au Ag Pt Pd Rh Ru Cu Zn Ni Cd The type of measurable elements: Au, Ag, Pt, Pd, Rh, Ru, Cu, Zn, Ni, Cd 5 The largest measuring layers: layer 5 0.*3μm Measurement accuracy: 0.*3μm