タイトルまたは説明

~EXF***0 is based on Si-pin Diode Detection technology & is capable of detecting all metals.



Due to its high resolution detection capability, it detects any metal in lowest PPM concentration.



Thus low content elements are easily analyzed and detected for its presence in the Alloy.



This is essential function for Assay Labs & Testing Centers which provide certificates for tested sample.







~BENEFITS



Detects all elements in the range AL to U



Aesthetic design with elegant appearance



Easy to place sample



Multi format reports can be taken in PDF or Excel format



Real time system status monitor  with Touch operation



Print the report with Ornament image (Printer optional)



 

~Specifications:



Working Principle:  Energy Dispersive X-ray Fluorescence



Size(mm):  **0***0***0



Detection limit:  **0ppm Best substance effect



Precision:  ±*0ppm~0.1%



Expanded Uncertainty:  ≤0.*9%



Operating Environment:  Temperature**1~*6℃    Humidity ≤*0%



High Voltage:  0~*0KV/0~1MA



Detector:   Si-Pin**5Kev±5



Testable Elements: Any *0 Elements from whole elements (Na~U)



Main Structure: High-strength metal frame and industry plastic shell



N/G Weight(KG): *7 / *0

Applications:





Fast, precise and non-destructive metal testing for jewelry retailers, jewelry manufacturers, precious metal refineries, pawn shops, government quality inspection departments, banks, laboratories and tertiary institutions.