Prcbe Mini Series Probe Station failure analysis wafer prober

タイトルまたは説明

Product Features:
1.Small footprint (*4cm x *8cm x*9cm);
2.Very cost-effective;
3.Simple and easy operation;
4.Applied in tests for pads down to *0 micron or wafers up to 4";
5.For I-V / C-V test and RF test;
6.Short delivery time:Within two weeks for standard Mini probe station;
7.This probe station is sold with a MOTIC long working distance stero microscope.

Description:
1.Mini series probe station is designed with small footprint with very simple functions.They provide enough space and high price raio test with simple and efficient framwork and function design.
2.User will no longer have to wait for more than 8 weeks for a probe station.Standard Mini series cab be delivered within two weeks.
3.Mini series is compatible with various accessories which users to apply in various tests, such as I-V test with leakage performance less than **0fA, capacitive test with resolution of 0.1pF, and DC**7GHz microwave test, etc.
4.Mini series only provides basic probe station functions, which ease the use of a probe station.These functions include chuck X-Y, the movement and vacuum fixation for DUTs and wafers up to 4".
5.Four vibration isolation pads are installed under the probe station base to reduce the vibration from outside the probe station.
6.The compact and completely built-in vacuum pipes contribute a lot to the convenient operation of the chuck movement. User can efficiently perform tests without any disturbance from the vacuum pipe (whihc usually install at the rear side of the chuck).

Specifications:
Chunk