Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection

タイトルまたは説明

Semiconductor Test Probe Double-ended Pogo Pin SCPE**5 for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

 

This product SCPE**5 is the tiniest series in semiconductor test probes since its outside diameter is only 0.*5mm. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices.  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

 

Its parameters are as below.

Materials (plated)

Barrel:    Gold Clad, No Plated

Bottom Plunger:   Pd, No Plated

Top Plunger:  Pd, No Plated

Spring:   SWP, Au on Ni Plated

 

Electronic Specification:

Current Rating:     0.5 amp

Contact Resistance:      **0 milliohms max

Bandwidth:    *1.4 GHz at *1dB

Inductance:   1MHZ at *0.****9uH

Captance:      1MHZ at 0.*****5uF

 

Specifications:

Full Stroke:    0.8 mm

Rated Stroke: 0.6 mm

Spring Force: 9±2 gf at load 0.6 mm

Mechanical Life:    about *****0 cycles

 

Company Information:

Centalic Technology Development Ltd. was founded in ***0. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

 

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

 

Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. 

 
Our inspection equipment include outer diameter checking machines, profile projectors, one-key inspection instruments, 3 dimension microscopes, AOI machines, spring force testers, vickershardness testers, Metallurgical microscopes, X-ray plating thickness testers, salt spray testers, life testers, FDR testers, high and low temperature chambers, X-ray perspective inspection machines, network analyzers, HFSS, ADS, LCR meters, DC powers, DC electronic loads, withstand voltage testers, resistance meters, etc.


Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

 

Notice:

Stock: standard product. As usual, they are in stock.

Express: DHL, FedEx, UPS, etc.

Payment: T/T, PayPal