Atomic Force Microscope

Description

Introductions AA***0 Scanning Probe Microscope is the most innovated model. The unit has a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and ***** And the unit is designed to provide images of atomic scale to **0 micrometer. With a Digital Signal Processor (DSP) TMS**0C**2 inside the systems, AA***0 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA***0 SPM system. Features Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM; Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; SPM can be in liquid; Real-time temperature and humidity detecting; Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve; Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode; Fast automatically tip-engaging Simply change the tip holder to switch between STM and AFM; Full digital control, auto system status recognition; Adjustable lightening inside With a **-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved; Controller and Computer connected through a *0M/**0M Fast Ethernet; Large sample size: up to diameter *5mm, *0mm thick; Online Control Software and offline Image Processing Software for Windows; Trace-Retrace scan, Back-Forward scan; Online real-time 3D image; Automatically Brightness and Contrast refresh; Data can be loaded out for further analysis; Nano-Movie function: Continuous data collection, storage and replay; Multi-Analysis: Granularity and Roughness; Tip Estimation and Image Re-construction; Modularized design for convenience of maintenance and future upgrade; Second display monitor and optical microscope system attachable; Specifications Functions Atomic Force Microscope (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; Lateral Force Microscope (LFM); Scanning Tunneli