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連絡先担当者 Mr. Angstrom
95 Mill Street, Stoughton, Massachusetts
Angstrom Advanced sets the standard in
Ellipsometry-bringing the best in ellipsometry technology at the
most affordable prices.Angstrom Advanced offers full range of
ellipsometers for thin film thickness measurements, optical
characterization for refractive index and extinction coefficient
analysis (n & k). Our ellipsometers can be used for many
different applications and are used in some of the most prestigious
laboratories such as MIT, NASA, UC Berkeley, Yale University, Duke
University, NIST and many more. The PHE**1 is the latest discrete wavelength ellipsometer with many new features, such as material library, wide variable angle, a second laser for alignment and a powerful software making the instrument with high accuracy and repetition. |
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