Description
Double-ended Pogo Pin
Test Probe SCPA**0 for IC Inspection
Semiconductor test probes are
usually called double-ended pogo pins. Common tip styles include B,
J, J1, U, U1, etc. All of the probes are extremely thin and
miniature, however, the requirement for their test accuracy is very
strict. They are mainly applied to the fields of semiconductor
tests and frequency tests of communication devices, for example,
the frequency tests of mobile phones, walkie-talkies, computers,
etc.
This product SCPA**0 we will
introduce is 1 mm in barrel diameter. It can be applied to the
tests of products which requires relatively high accuracy, for
example frequency tests of semiconductor and communication
devices. Developed and manufactured on our own, this product
takes the lead in the test industry. Our complete production lines
can also meet the needs for mass production.
The barrel of this double-ended
pogo pin is made from phosphor bronze plated with gold. The bottom
plunger is made from SK4 plated with nickel and gold. The same is
with the top plunger. The inner spring is made from SUS**4 plated
with gold and nickel. This probe pin could withstand the current up
to 6 amps. The typical maximal contact resistance is about *0
milliohms.
The plunger can be pressed at a
distance of up to 3.1 mm. But it is better to be pressed at a
distance of 2 mm at most in working environments. Otherwise, the
spring will probably be damaged severely under constant pressure.
When the plunger is pressed at a distance of 2 mm, the loaded force
is about *0 gf, which fluctuates to a tolerance.
For details, please check
parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni
Plated
Bottom Plunger: SK4, Au on Ni
Plated
Top Plunger: SK4, Au on Ni
Plated
Spring: SWP-A/B, Au on Ni
Plated
Electronic
Specification:
Current Rating: 6
amps
Contact Resistance: *0 milliohms
max
Bandwidth: *1.7 GHz at
*1dB
Inductance: 1MHZ at *0.****3
uH
Captance: 1MHZ at 0.*****2
uF
Specifications:
Full Stroke: 3.1 mm
Rated Stroke: 2 mm
Spring Force: *0±*0 gf at load 2
mm
Mechanical Life: about *****0
cycles
For more information, please
check below catalog.
Company
Information:
Centalic Technology Development
Ltd was founded in ***0. Specializing in R&D, manufacture,
sales and technical service, Centalic is one of the earliest
high-tech enterprises which concentrates on large-scale production
of various test probes and precision metal parts, and has a
professional manufacturing base owning complete production lines
and test equipment.
Our products include
semiconductor test probes, in-circuit test probes, radio frequency
probes, harness probes, battery contact probes, switching probes,
big-current probes, spring probes, universal complex test probes,
wafer probes, and so on. They are widely applied to the tests of
various electronic products, such as in-circuit tests of
semiconductor components, chips, PCB and other electronic
peripherals.
Our company owns professional
R&D, production, sales teams under the working principle of
\'quality, punctuality, confidentiality\' to totally efficiently
develop test probes in accordance with the requirements of
customers\' test projects and meet the needs of customers for mass
production as well as developing markets. With many years\'
continuous endeavour of our staff, Centalic has built a solid
foundation in this industry and our products have been sold all
over the world.
Welcome to browse our website
centalic.com and download any catalogs of our products. If you need
a complete set of product manual, please feel free to contact us.
Many products are not uploaded due to a huge range. If you can\'t
find what you need, please feel free to contact us.
Notice:
Stock: standard product. As
usual, they are in stock.
Express: DHL, FedEx, UPS,
etc.
Payment: T/T,
PayPal
